Atomic force microscopes for research
Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.
The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy cantilever alignment and high-resolution sample survey.
The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with features of the atomic force microscopy system (alpha300 A) for high-resolution nanoscale surface characterization and thus facilitates a comprehensive understanding of the samples.
The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and Nearfield-Raman (Raman-SNOM) imaging can be easily performed.