Юрий Железнов


+7 495 9381866
Fax: +7 495 9381907


Hartmann-Shack wavefront sensor
Hand-held light meter & optometer
Research picoammeter with Wifi
Research radiometer with Wifi
UV-CureRight Radiometer
Datalogging optometer
MSH-300 with variable slits & MSH-300F with fixed slits
MSH-150 with variable slits & MSH-150F with fixed slits
MSHD-300 with variable slits & MSHD-300F with fixed slits
High-end thermography cameras
CCD cameras for direct detection (<20 keV)
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
Motorized Czerny-Turner spectrographs
EMCCD cameras
Photo lithography systems
Echelle spectrograph
Low-noise CCD detectors
EMCCD detectors for spectroscopy
sCMOS cameras
CCD cameras with shutter
High-performance CCD detectors
NIR spectroscopy with photo diode array
Manual single grating spectrograph
Cameras and detectors for time-resolved imaging and spectroscopy
High-throughput transmission grating spectrograph
Closed-cycle optical cryostat
3D optical surface profiler with smart PSI and true color measurements
NIR compact camera
SWIR spectral camera
MWIR spectral camera
LWIR spectral camera
Multipoint spectrometers
Hyperspectral single core scanner
Closed-cycle optical cryostat with intermediate sample chamber and integrated cold sample electronics size
VIS/NIR spectral cameras
VIS/NIR compact camera
VIS/NIR all-in-one compact camera
Physical Property Measurements in a cryogen-free system (PPMS DynaCool)
Physical Property Measurement System (PPMS)
Ultra stable closed-cycle optical cryostat
Portable, cryogen-free material characterization platform
Kerr magnetometer
Cryogenic temperature monitors
Cryogenic accessories
Cryogenic temperature sensors
Closed-cycle optical cryostat with breadboard
Advanced technology helium gas purifier
Advanced technology helium liquefier
Vibrating Sample Magnetometer (VSM) with electromagnet
AC Susceptometer
MPMS3 SQUID magnetometer
Helium recovery and liquefaction plants
Cryogenic temperature controllers
Interferometer optimized for production metrology
White light interferometer for roughness
Dynamic metrology
Phase shifting Fizeau interferometer with ring light source
Wavelength shifting Fizeau interferometer for multi surface cavities
White light interferometer automated for production
White light interferometer for general purposes
Phase shifting Fizeau interferometer
3D metrology of aspheric surfaces
Phase shifting Fizeau interferometer with vibration tolerant algorithm
2 and 4 mirror infrared single crystal furnace
FC-Series - Fibre-coupled CCD cameras
Application: In-situ TEM
LV-Series - For low-voltage TEM applications
Cameras for indirect detection (>20 keV)
Particle size analyzer
Arc single crystal furnace
Standard near infrared camera
Uncooled thermal camera
Fast large format camera covering visible to near infrared
Compact SWIR camera
Small, uncooled near infrared camera
High performance NIR camera
Fast large formate near infrared camera
Low-light level near infrared camera
Compact near infrared camera
Flexible small near infrared camera
Cooled mid infrared camera
Small camera covering visible to near infrared
Cooled camera covering visible to near infrared
Small uncooled camera covering visible to near infrared
Imaging spectrograph NIR and SWIR
Airborne continuous VNIR and SWIR hyperspectral system
Airborne fluorescence hyperspectral imaging system
Imaging spectrograph MWIR
Compact airborne VNIR and eNIR hyperspectral system
Airborne thermal hyperspectral system
Hyperspectral drill core imaging station
Hyperspectral chemical imaging analyzer
Imaging spectrographs VIS and VisNIR
DE-Series - Direct detection cameras
Application: Material science
Stand-alone X-ray cameras
Optical tweezers
Application: Biological Cryo-EM
Carbon nanotube characterization



Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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© LOT Quantum Design 2016